The EYES tool uses the survey sampling property estimation technique. The method involves taking a large number of small layout samples from the IC layout and extracting property measurements (critical areas etc.) from these samples. These measurements are then used to estimate the properties of the IC layout as a whole. Typically, 4096 samples are used, which for large chips can often represent less than 1% of the chip area. The software is used in the prediction of integrated circuit yield.
The EYES user manual is here, and an example of EYES output is here.
The EYES software can be leased from the University of Edinburgh. A licensing opportunities leaflet can be found here
Telephone: +44 131 650
5602
Fax +44 131 650 6554
Email Gerard.Allan@ee.ed.ac.uk
Last modified: Fri Jun 13 13:02:49 BST 2003